000			02089cam a22003373u 4500
001			34307
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005			20260610133801.0
006			m
007			cr n
008			260607r2010||||utu|||||o|||||||||||||| d
010			_a20010063
040			_aUtSlPG
041		7	_aen _2iso639-1
050		4	_aLB
100	1		_aTerman, Lewis M. _q(Lewis Madison), _d1877-1956
245	1	0	_aCondensed guide for the Stanford revision of the Binet-Simon intelligence tests
264		1	_aSalt Lake City, UT : _bProject Gutenberg, _c2010
300			_a1 online resource : _bmultiple file formats
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aRelease date is 2010-11-13
508			_aProduced by Ron Swanson
520			_a"Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests" by Lewis M. Terman is a scientific publication written in the early 20th century. The book serves as a practical handbook for the administration of the Stanford Revision of the Binet-Simon intelligence tests, aiming to streamline the application of these assessments while providing guidelines for effective testing practices. In this concise guide, Terman emphasizes the importance of a solid understanding of the original testing procedures and the psychological principles underlying them. It includes detailed instructions for each test, along with tips for effective examination techniques. Furthermore, the guide discusses common mistakes to avoid and provides essential commands that are fundamental to conducting the tests accurately. This resource is particularly beneficial for experienced examiners looking for a supplementary tool to facilitate their work while ensuring that the integrity of the testing process is maintained. (This is an automatically generated summary.)
534			_nOriginal publication data not identified
653			_aIntelligence tests
653			_aStanford-Binet Test
653			_aBinet-Simon Test
856	4	0	_uhttps://www.gutenberg.org/ebooks/34307
999			_c75153 _d75153